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Patrick Adrian Conge is an experienced Application Engineer at Nash Technologies since November 2022, with a robust background in test engineering and development spanning over 15 years. Prior roles include Staff Test Engineer and Senior Test Engineer at STMicroelectronics from September 2016 to October 2022, and Senior Test Development Engineer at Fairchild from January 2015 to September 2016. Additional experience includes positions as Test Development Engineer 2 at Analog Devices, Analog/Mixed-Signal IC Designer at Mobien Corporation, and a role in Failure Analysis at Texas Instruments. Patrick holds a Master of Science in Analog and Mixed-Signal IC Design from National Taipei University and a Bachelor of Science in Electronics and Communications from the University of San Carlos.