ÂÜÀòÂÒÂ×

Tom Kopley serves as the Sr. Director of Reliability at Nexgen Power Systems since May 2021. Previous roles include Director of Technology and Device Reliability at ON Semiconductor, and Manager of Technology and Device Reliability at Fairchild Semiconductor, focusing on quality and reliability across various domains. Tom has extensive experience in advanced process technology development, particularly in MOS device reliability, while also contributing as an adjunct professor at Santa Clara University. Early career contributions include significant research and development roles at Agilent Technologies, HP, Siemens AG, and MIT, complemented by a Ph.D. in Applied Physics from Yale University and a BS in Electrical and Electronics Engineering from the University of Rochester.