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Vincent Kerzerho is a tenured researcher at LIRMM, affiliated with CNRS since January 2011. Prior to this role, Vincent held various postdoctoral positions, including a collaboration project at the University of Twente and CNRS/LIRMM focusing on machine-based-learning test methods for RF circuits. Vincent completed a PhD at NXP Semiconductors and LIRMM, where research centered on a design-for-test technique for integrated DACs and ADCs, resulting in significant cost reductions and validation through simulations and laboratory experiments. Educational qualifications include a PhD in Electrical Engineering from the University of Montpellier, alongside MD degrees in research and electrical engineering from Université Montpellier II.