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Don (Sangdon) Lee is an experienced director at GCT Semiconductor, where a career spanning over two decades includes roles as R&D Manager and Application Engineer. Expertise encompasses RF reference design and verification, team management, and various chipset evaluations, including LTE, WiMAX, and Wi-Fi technologies. Notable achievements include the development of 5G RF test chipset evaluations and support for CDMA and GSM projects. Prior experience at Samsung Electronics involved collaborating on RF product development and creating test programs for RFIC chipsets. Don holds a Master’s and Bachelor’s degree in Electronic Engineering from Ajou University, with a focus on microwave applications.