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Michael Varney is an accomplished Chief Scientist at Exnodes Inc., specializing in the design and development of the Computational Parallel Inspection® AI platform for the rapid detection and analysis of defects in computing chips. With experience at leading companies including Corning Incorporated as a Research Associate and Intel Corporation as a Yield Engineer, Michael has a strong foundation in optical systems, process control, and statistical analysis of large datasets. Prior academic roles at the University of Colorado Boulder involved extensive research in liquid crystal physics and nanophotonics. Michael's educational background includes a Ph.D. in Physics and multiple degrees in Physics and Mathematics from the University of Colorado Boulder and Colorado State University, complemented by a certification in Technical Project Management from UCLA Extension.