萝莉乱伦

Jim Tai is a Senior Signal Integrity Engineer at Etron Technology Inc. since September 2015, specializing in IC performance measurement, including Insertion Loss, Return Loss, and Crosstalk. Previously, Jim worked as a Signal Integrity Simulation and Validation Engineer at Wistron from December 2013 to August 2015, focusing on high-speed signal channel simulation for SerDes and Parallel systems. Earlier in Jim’s career, from January 2011 to November 2013, Jim served as a Lithographic Process Engineer at TSMC, where responsibilities included CD-SEM measurement, overlay measurement, photo resistance thickness measurement, and defect inspection within the Nano Lithography Engineering Department. Jim holds a Master’s degree in Optical Electronics from National Cheng Kung University (2006 - 2008) and a Bachelor of Science in Physics from National Sun Yat-sen University (2002 - 2006).