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Ming-Chen Lee is a seasoned Senior Test Engineer with over 23 years of experience in the semiconductor industry, currently working at Analog Devices since July 2011. Prior to this role, Ming-Chen served as a Senior Product Test Engineer at MediaTek from January 2008 to June 2011, where responsibilities included designing multi-sites device interface boards for ATE, collaborating with global engineering teams, and developing ATE test strategies. Ming-Chen also held a position at Analog Devices from July 2000 to January 2008, focusing on the implementation of ATE systems and analyzing yield data for analog mixed-signal devices. Ming-Chen holds a degree from McGill University, attended from 1996 to 2000.