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Bin Wang is an experienced Applications Engineering Manager at Advantest since January 2012, overseeing a team dedicated to developing ATE test solutions for analog, high power, automotive, and consumer PMIC ICs. Prior to this role, Bin Wang served as an Application Engineer, where responsibilities included developing ATE test solutions across multiple Advantest platforms and converting applications from Teradyne testers. Bin Wang's career at Advantest began in August 2005 as a System Engineer, focusing on ATE test solutions development, test program design, and production deployment. Bin Wang holds a Bachelor of Engineering degree in Microelectronic Science and Engineering from Beijing University of Technology, completed in 2005.