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Conal McIntyre is an experienced Instrument Scientist at SiriusXT, specializing in the development of a lab-based microscope for imaging sub-cellular structures with soft X-ray tomography since February 2023. Prior to this role, McIntyre worked as a Project Intern at cosine measurement systems, where the focus was on particle contamination in silicon pore optics manufacturing. McIntyre's background includes a significant tenure at Intel Corporation as a Senior Product Development Engineer, managing integrated circuit testability and manufacturability, and developing complex software for design validation. Earlier experience encompasses a Research Assistant position at the University of Wollongong and a solid educational foundation with a Master of Science in Space Science & Technology from University College Dublin, a Post Graduate Certificate in Statistics from Trinity College Dublin, and a BA (HONS) in Nanoscience, Physics & Chemistry of Advanced Materials from Trinity College Dublin.