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Sidonie Lefebvre is a Research Engineer at ONERA since February 2007, specializing in the Optique Théorique et Appliquée department. Expertise includes sensitivity analysis, uncertainty propagation, machine/deep learning, statistical learning, optimization, and anomaly detection. Key research themes involve sensitivity analysis, aircraft detection and classification in infrared, processing of multispectral imagers and spectrometers, and cloud background synthesis. Additionally, Sidonie supervised the doctoral thesis of Suzanne Varet, focused on statistical methods for infrared signature prediction. Previously, from November 2003 to October 2006, Sidonie worked at Altis Semiconductor as a doctoral candidate, coordinating production line sample design, obtaining a patent for a process, and conducting nanoindentation testing. Sidonie holds a Doctorate in Mécanique des Matériaux from CentraleSupélec (2003-2006) and a DEA in Equations aux Dérivées Partielles et Calcul Scientifique from Paris-Sud University (1999-2002).