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Stef Wubben is an experienced AIT Engineer at Nearfield Instruments B.V. since August 2022, focusing on the assembly, integration, and testing of scanning probe metrology solutions for the semiconductor industry. Prior experience includes roles as an Industrial Automation Designer and Junior Designer Trainee at KienIA Industriële Automatisering (May 2020 - June 2022) and an Engineering Intern at ExxonMobil, where a modeling project aimed at optimizing hydrogen usage was completed. Additionally, Stef has served as a Teaching Assistant in Calculus and Introductory Practical courses at Delft University of Technology. Educational qualifications include a Master's degree in Applied Physics and a Bachelor's degree in Applied Physics, alongside a minor in Finance, all obtained from Delft University of Technology.