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Ekamdeep Singh is an accomplished professional with extensive experience in NAND reliability and product engineering, currently serving as Director of NAND Reliability at Micron Technology since October 2018, after holding the position of Senior Manager of Product Engineering at SanDisk® from October 2010 to October 2018. At Micron Technology, Ekamdeep leads the 5th Generation 3D NAND Defect Management and manages a team of eight engineers, while at SanDisk, contributions included innovations in 3D NAND DPPM reduction, successful SSD ramp initiatives, and leading defect screening management efforts for TLC memory. Ekamdeep holds a Master’s Degree in Electrical Engineering from San Jose State University and a Bachelor’s Degree in Electronics and Communications Engineering from Guru Nanak Dev University.