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Sean Nicolaysen is a skilled engineering manager currently serving as the Wafer Inspection Engineering Manager at LA Semiconductor since October 2022, overseeing all defect metrology functions at Fab1. Prior experience includes roles such as Senior Device Engineer at ON Semiconductor and Sr Device Tech Engineer at Cypress Semiconductor Corporation, where responsibilities encompassed yield enhancement, process integration, and defect metrology. Sean has also held various research and tutoring positions, contributing to projects focused on electrospun polymers and CO2 leakage monitoring methodologies. Sean holds a Master of Engineering in Electrical Engineering from Montana State University and a Bachelor of Science in Physics from Brigham Young University - Idaho.