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Tom Tiwald has extensive experience in the field of engineering, currently serving in the Ellipsometry Applications engineering group at J.A. Woollam Co., Inc. since August 1999. In this role, Tom assists customers in utilizing ellipsometry for a variety of applications, including infrared optical materials, optical properties as a function of temperature, and monitoring and controlling coating processes. Prior to this position, Tom worked as a Surface Analysis Engineer at Motorola Semiconductor Products from August 1988 to August 1994, focusing on the surface analysis of semiconductor surfaces utilizing techniques such as Secondary Ion Mass Spectrometry and Auger Electron Spectroscopy. Tom holds a Doctor of Philosophy (Ph.D.) in Engineering from the University of Nebraska-Lincoln, earned between 1994 and 1999.