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Bedig Boghossian is a Senior Staff Engineer specializing in GaN Test Development and Reliability at Infineon Technologies since September 2021. Prior to this role, Bedig served as a Product Reliability Engineer and System/Reliability Engineer at Crossbar Inc. from November 2016 to September 2021. Bedig holds a Bachelor of Science degree in Electrical and Electronics Engineering from San Jose State University, completed between 2017 and 2019.