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Mark Tunik is an experienced professional in defect metrology and yield control within the semiconductor industry. Currently serving as Manager of the Defect Metrology Technology Team at Hitachi High-Tech America, Inc. since March 2020, Mark previously held key roles at Micron Technology, including Senior Yield Control Engineer and Technology Development Defect Reduction Module Owner. Mark's expertise encompasses process integration, quality assurance collaboration, and proactive yield issue resolution across FLASH and DRAM technologies. Prior to Micron, Mark contributed to defect inspection systems at Numonyx and Intel, where roles ranged from application engineer to process technician. Mark holds degrees in Industrial Engineering & Management from SCE College of Engineering and Electronic and Control systems from Sapir Technology College.