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Nick Yeh is a seasoned Test Engineer with extensive experience in developing and managing test programs across various companies in the semiconductor industry. Currently at DSP Group since November 2010, Nick oversees DECT product issues during mass production while reporting to DSPG Israel. Previously, from November 2008 to November 2010, Nick worked as a Testing Engineer at Alchip Technologies, developing test projects on Verigy 93K and Teradyne J750. Prior experience includes developing RF Tuner Test Programs at Afond Technologies and test program development on PXI test systems at ASE Group. Nick holds a Bachelor's degree in Microelectronics from Sichuan University, completed in 2005.