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David Mo is a seasoned Sr. Product Engineer at Aptina Imaging, with experience since January 2005 in project management that focuses on bringing new CMOS image sensors from design to customer production. Responsibilities include designing and implementing die-level test plans to screen for manufacturing defects while ensuring performance and qualifying silicon efficiently. Prior to this role, David served as a CMOS Imaging Engineer Intern at Micron Technology from May to November 2004, where responsibilities included lab work and data analysis for production and design support. David holds a Bachelor of Science degree in Computer Engineering from Virginia Tech, obtained in 2005.